SAMPLE REQUIREMENTS
AES/SAM
  • Conductors (such as metal coating, metal contact on PCB, electronic connector, integrated circuit, wafer, etc.)
  • Insulators are possible with ion neutralizer and proper charging reduction (such as thin ceramic coating on metal, organic coating and composite material, etc.)
  • Sample must be vacuum compatible (i.e., any solid or residue in liquid after drying that will not sublime under vacuum)
  • Magnetic sample must be demagnetized before analysis
  • Sample cutting is required for fitting the dimensional requirements
XPS/ESCA
  • Applicable for both of conductors (such as metal coating, metal contact on PCB, electronic connector, integrated circuit, etc.) and insulators (such as polymers, mineral, ceramics, glass, paper, etc.)
  • Sample must be vacuum compatible (i.e., any solid or residue in liquid after drying that will not sublime under vacuum)
  • Magnetic sample must be demagnetized before analysis
  • Sample cutting is required for fitting the dimensional requirements
SEM
  • Conductors such as metal, semiconductor
  • Insulators are possible with application of conductive coating on the surface
  • Sample must be vacuum compatible (i.e., any solid or residue in liquid after drying that will not sublime under vacuum)
  • Magnetic sample must be demagnetized before analysis
  • Sample cutting is required for fitting the dimensional requirements
OM
  • Applicable for all solid surface, semi-solid and suspension in liquid
  • Sample cutting is required for fitting the dimensional requirement