TEST EQUIPMENT LIST
|
Technique
|
Equipment Model
|
Description
|
|---|---|---|
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Auger Electron Spectroscopy (AES/SAM)
|
PHI 680 Scanning Auger Nanoprobe
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|
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X-ray Photoelectron Spectroscopy (XPS/ESCA)
|
PHI Quantera Scanning X-ray Microprobe
|
|
|
Scanning Electron Microscopy (SEM)
|
PHI 680 Scanning Auger Nanoprobe
|
|
|
Optical Microscopy (OM)
|
Nikon MM-400 measuring microscope
|
|
|
SK-HZM digital microscope
|
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Precision cutting
|
MTI SYJ-200 precision cutting saw
|
|
|
Micro-sectioning
|
MTI EQ-Unipol-820 dual platens grinder/polisher
|
