TEST EQUIPMENT LIST
Technique
Equipment Model
Description
Auger Electron Spectroscopy (AES/SAM)
PHI 680 Scanning Auger Nanoprobe
X-ray Photoelectron Spectroscopy (XPS/ESCA)
PHI Quantera Scanning X-ray Microprobe
Scanning Electron Microscopy (SEM)
PHI 680 Scanning Auger Nanoprobe
Optical Microscopy (OM)
Nikon MM-400 measuring microscope
SK-HZM digital microscope
Precision cutting
MTI SYJ-200 precision cutting saw
Micro-sectioning
MTI EQ-Unipol-820 dual platens grinder/polisher